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F-26 Micro-XRF Analysis of Thin Films and Coatings Using Fundamental Parameters

Powder Diffraction - United States
doi 10.1154/1.1779778
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Categories
InstrumentationRadiationCondensed Matter PhysicsMaterials Science
Date

June 1, 2004

Authors
W. T. ElamR. B. ShenB. ScruggsJ. Nicolosi
Publisher

Cambridge University Press (CUP)


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