Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors
Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927617008182
Full Text
Open PDFAbstract
Available in full text
Categories
Date
July 1, 2017
Authors
Publisher
Cambridge University Press (CUP)