Amanote Research
Register
Sign In
Voltage-Controlled Topotactic Phase Transition in Thin-Film SrCoOx Monitored by in Situ Xray Diffraction
doi 10.1021/acs.nanolett.5b04492.s001
Full Text
Open PDF
Abstract
Available in
full text
Date
Unknown
Authors
Unknown
Publisher
American Chemical Society (ACS)
Related search
Detailed Study of the Nanocasting Process by in Situ Xray Scattering and Diffraction
In Situ Thin Film Measurements.
In-Situ Observation of 2-Dimensional X-Ray Diffraction of Organic Thin-Film Growth by Synchrotron Radiation
Hyomen Kagaku
Room Temperature In-Situ Measurement of the Spin Voltage of a BiSbTe3 Thin Film
Scientific Reports
Multidisciplinary
Phase Separation in Fluorite-Related U1yCeyO2x: A Re-Examination by Xray and Neutron Diffraction
In-Situ Thin Film Growth of PbTiO3 by Multi Target Sputtering
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Nb3Sn Nucleation and Growth in Multifilament Superconducting Strands Monitored by High Resolution Synchrotron Diffraction During in Situ Reaction
Applied Physics Letters
Astronomy
Physics
Phase Transition and Ordering Behavior of Ternary Ti–Al–Mo Alloys Using In-Situ Neutron Diffraction
International Journal of Materials Research
Alloys
Condensed Matter Physics
Metals
Theoretical Chemistry
Materials Chemistry
Physical
Simulation Method of Threshold Voltage Shift in Thin-Film Transistors
Journal of the Korean Institute of Electrical and Electronic Material Engineers