Charging-Induced Changes in Reverse Current–Voltage Characteristics of Al/Al-Rich $\Hbox{Al}_{2}\hbox{O}_{3}/\Hbox{p-Si}$ Diodes
IEEE Transactions on Electron Devices - United States
doi 10.1109/ted.2009.2026110
Full Text
Open PDFAbstract
Available in full text
Date
September 1, 2009
Authors
Publisher
Institute of Electrical and Electronics Engineers (IEEE)