Analysis and Analytical Modeling of Static Pull-In With Application to MEMS-Based Voltage Reference and Process Monitoring

Journal of Microelectromechanical Systems - United States
doi 10.1109/jmems.2004.824892
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Related search

Micromechanical Voltage Reference Using the Pull-In of a Beam

IEEE Transactions on Instrumentation and Measurement
Electronic EngineeringElectricalInstrumentation
2001English

Modeling and Scheduling of MEMS-Based Storage Devices

1999English

Statistical Analysis of Process Monitoring Data for Software Process Improvement and Its Application

American Journal of Operations Research
2012English

Application of Distribution Static Compensator (D-Statcom) to Voltage Sag Mitigation

Universal Journal of Electrical and Electronic Engineering
Electronic EngineeringElectrical
2013English

Development of Sustainable Procurement Monitoring System Performance Based on Supply Chain Reference Operation (SCOR) and Analytical Hierarchy Process (AHP) on Leather Tanning Industry

MATEC Web of Conferences
Materials ScienceEngineeringChemistry
2018English

Semi-Analytical Magnetic-Structural Coupling With Contact Analysis for MEMS/NEMS

2010English

Modeling, Analysis, and Design of Stationary Reference Frame Droop Controlled Parallel Three-Phase Voltage Source Inverters

2011English

Semi-Analytical Modeling and Analysis of Halbach Array

Energies
ControlElectronic EngineeringEnergy EngineeringRenewable EnergyEnergyFuel TechnologySustainabilityOptimizationElectricalPower Technologythe Environment
2020English

Comments to &Quot;Hierarchical Sensitivity Analysis for Large-Scale Process-Based Hydrological Modeling With Application in an Amazonian Watershed" Submitted to HESS.

2020English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy