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Photoellipsometry Determination of Surface Fermi Level in GaAs (100)

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films - United States
doi 10.1116/1.578444
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Abstract

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Categories
SurfacesFilmsInterfacesCondensed Matter PhysicsCoatings
Date

July 1, 1993

Authors
Yi‐Ming XiongPaul G. SnyderJohn A. Woollam
Publisher

American Vacuum Society


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