Controlling Beam-Sample Interaction in Low Dimensional Materials by Low Dose Rate Electron Microscopy

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927615007394
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Low-Dose Microscopy and Beam Damage Study of Infiltrated Zeolite Y

Microscopy and Microanalysis
Instrumentation
2016English

Low-Energy Broad Area Electron Beam for Etching Microelectronic Materials

Vacuum
SurfacesInstrumentationCoatingsCondensed Matter PhysicsFilms
1989English

Three-Dimensional Cathodoluminescence by Focused Ion Beam - Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2013English

Low-Energy Electron Projection Microscopy

Le Journal de Physique Colloques
1989English

Ultra-Low Voltage Scanning Electron Microscopy

Microscopy Today
1996English

Enterovirus Typing by Immune Electron Microscopy Using Low-Speed Centrifugation.

Journal of Clinical Pathology
MedicineForensic MedicinePathology
1980English

Low-Dose Strain Mapping by Dark-Field Inline Electron Holography

Microscopy and Microanalysis
Instrumentation
2011English

Physics of Low Voltage Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2002English

Electron Beam Dynamics for a Low-Energy Electron Linac

English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy