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Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric T-Sne
Entropy
- Switzerland
doi 10.3390/e20080604
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Categories
Electronic Engineering
Information Systems
Mathematical Physics
Electrical
Astronomy
Physics
Date
August 14, 2018
Authors
Wei He
Yigang He
Bing Li
Chaolong Zhang
Publisher
MDPI AG
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