Charge Density at the Al-=sub=-2-=/Sub=-O-=sub=-3-=/Sub=-/Si Interface in Metal-Insulator-Semiconductor Devices: Semiclassical and Quantum Mechanical Descriptions
Журнал технической физики
doi 10.21883/ftp.2017.12.45185.8190
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Date
January 1, 2017
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Ioffe Institute Russian Academy of Sciences