Progress in a New Method of Thickness Measurement by X-Ray Analysis in TEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927617000836
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy