In Situ TEM Observation of Electromigration in Ni Nanobridges
doi 10.1002/9783527808465.emc2016.5585
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Date
December 20, 2016
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Wiley-VCH Verlag GmbH & Co. KGaA
Available in full text
December 20, 2016
Wiley-VCH Verlag GmbH & Co. KGaA