Amanote Research
Register
Sign In
Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy
doi 10.1021/acs.nanolett.9b02717.s001
Full Text
Open PDF
Abstract
Available in
full text
Date
Unknown
Authors
Unknown
Publisher
American Chemical Society (ACS)
Related search
Defect Characterization Using Transmission Scanning Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution
Microscopy and Microanalysis
Instrumentation
Crystal Structure Analysis Using Scanning Transmission Electron Microscopy
Nihon Kessho Gakkaishi
Near Band Edge Excitation in 2D Materials by Transmission Electron Microscopy
Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
Microscopy Today
Efficient Elastic Imaging of Single Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Depth Sectioning of Individual Dopant Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
Atomic-Scale Monitoring of Electrode Materials in Lithium-Ion Batteries Using in Situ Transmission Electron Microscopy
Advanced Energy Materials
Materials Science
the Environment
Sustainability
Renewable Energy
Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy Using μSTEM
Microscopy and Microanalysis
Instrumentation
