Amanote Research

Amanote Research

    RegisterSign In

Failure Mechanisms in Beam Lead Semiconductors

Microelectronics Reliability - United Kingdom
doi 10.1016/0026-2714(77)90457-7
Full Text
Open PDF
Abstract

Available in full text

Categories
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
Date

January 1, 1977

Authors

Unknown

Publisher

Elsevier BV


Related search

Immune Mechanisms in Heart Failure

European Journal of Heart Failure
Cardiovascular MedicineCardiology
2017English

Droplet Controlled Growth Dynamics in Molecular Beam Epitaxy of Nitride Semiconductors

Scientific Reports
Multidisciplinary
2018English

Strain Mechanisms in Lead-Free Ferroelectrics for Actuators

Springer Theses
2016English

Failure Mechanisms in Wet Tantalum Capacitors

ElectroComponent Science and Technology
1976English

High Temperature Failure Mechanisms in Ceramics

Acta Metallurgica
1980English

Texture Development Mechanisms in Ion Beam Assisted Deposition

Journal of Applied Physics
AstronomyPhysics
1998English

Transient Annealing of Semiconductors by Laser, Electron Beam and Radiant Heating Techniques

Reports on Progress in Physics
MedicineAstronomyPhysics
1985English

Operational Shock Failure Mechanisms in Hard Disk Drives

Journal of Tribology
Mechanics of MaterialsSurfacesMechanical EngineeringInterfacesFilmsCoatings
2014English

Analysis of Failure Mechanisms in a Planetary Gear

INTERNATIONAL ENGINEERING JOURNAL - IENGJ
2013English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy