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Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;

Materia Japan
doi 10.2320/materia.51.545
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Abstract

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Date

January 1, 2012

Authors
Toshiaki SuzukiYoshimasa Takahashi
Publisher

Japan Institute of Metals


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