Development of At-Wavelength Metrology Using Grating-Based Shearing Interferometry at Diamond Light Source

Journal of Physics: Conference Series - United Kingdom
doi 10.1088/1742-6596/425/5/052021
Full Text
Abstract

Available in full text

Date
Authors
Publisher

IOP Publishing

Related search

At-Wavelength Metrology of X-Ray Optics at Diamond Light Source

2014English

VMXi – Development of Anin situMX Beamline at Diamond Light Source

Acta Crystallographica Section A: Foundations and Advances
Materials ScienceCondensed Matter PhysicsTheoretical ChemistryBiochemistryStructural BiologyInorganic ChemistryPhysical
2015English

Treatment of X-Ray Diffraction Data at Diamond Light Source

Acta Crystallographica Section A: Foundations and Advances
Materials ScienceCondensed Matter PhysicsTheoretical ChemistryBiochemistryStructural BiologyInorganic ChemistryPhysical
2017English

Fiber-Bragg-Grating Vibration Sensor With Temperature Stability Using Wavelength-Variable Incoherent Light Source

Acoustical Science and Technology
AcousticsUltrasonics
2002English

Nondestructive Evaluation Using Shearing Interferometry

1992English

At-Wavelength Metrology on Sc-Based Multilayers for the UV and Water Window

2003English

Macromolecular Crystallography Beamlines at Diamond Light Source: Current Capabilities and Future Plans

Acta Crystallographica Section A Foundations of Crystallography
2010English

Low Energy X-Ray Grating Interferometry at the Brazilian Synchrotron

Optics Communications
Electronic EngineeringElectronicMolecular Physics,Theoretical ChemistryOpticalElectricalAtomicMagnetic MaterialsOpticsPhysical
2017English

Monolithic InP-based Grating Spectrometer for Wavelength-Division Multiplexed Systems at 1.5 Μm

Electronics Letters
Electronic EngineeringElectrical
1991English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy