Electron Optical Benches for In‐line and Branched Systems. A New Bench Designed for Mirror‐based Aberration Correction and Low Energy Electron Microscopy

Review of Scientific Instruments - United States
doi 10.1063/1.1144548
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Aberration Correction and Electron Holography

Microscopy and Microanalysis
Instrumentation
2009English

Low-Energy Electron Projection Microscopy

Le Journal de Physique Colloques
1989English

Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?

Microscopy and Microanalysis
Instrumentation
2009English

Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review

Microscopy and Microanalysis
Instrumentation
2011English

Foreword for the Special Issue on the Tenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy

Ultramicroscopy
InstrumentationOpticsMolecular Physics,OpticalAtomicMagnetic MaterialsElectronic
2017English

Current and Future Aberration Correctors for the Improvement of Resolution in Electron Microscopy

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
MathematicsEngineeringAstronomyPhysics
2009English

Electron Beam Dynamics for a Low-Energy Electron Linac

English

In Situ Transmission Electron Microscopy for Energy Applications

Joule
Energy
2019English

Correction of Distortion Aberration in Electron Magnetic Lenses

International Journal of Applied Physics
2016English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy