Thermal Characterization of Silicon Integrated Spiral Inductors by Thermal Impedance Using Transient Thermography – First Approach
doi 10.21611/qirt.2010.064
Full Text
Abstract
Available in
Date
January 1, 2010
Authors
Publisher
QIRT Council
doi 10.21611/qirt.2010.064
Available in
January 1, 2010
QIRT Council