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Algorithm to Derive Optimal Mask and Movement Patterns in Moving Mask Deep X-Ray Lithography (M2DXL)

IEEJ Transactions on Sensors and Micromachines - Japan
doi 10.1541/ieejsmas.125.222
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Abstract

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Categories
Electronic EngineeringElectricalMechanical Engineering
Date

January 1, 2005

Authors
Naoki MatsuzukaOsamu Tabata
Publisher

Institute of Electrical Engineers of Japan (IEE Japan)


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