Amanote Research
Register
Sign In
Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method
Microscopy and Microanalysis
- United Kingdom
doi 10.1017/s1431927610054474
Full Text
Open PDF
Abstract
Available in
full text
Categories
Instrumentation
Date
July 1, 2010
Authors
H-J Kang
JH Kim
JW Oh
TS Back
HJ Kim
Publisher
Cambridge University Press (CUP)
Related search
Backside TEM Sample Preparation With the Multi-Loader Flip-Stage
Microscopy and Microanalysis
Instrumentation
FIB TEM Sample Preparation of Deeply Buried Interfaces
Microscopy and Microanalysis
Instrumentation
FIB Dual-Beam Sample Preparation for TEM Observation
Microscopy and Microanalysis
Instrumentation
Avoiding the Curtaining Effect: Backside Milling by FIB INLO
Microscopy and Microanalysis
Instrumentation
Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM With FIB: A Method Capable of Re-Thinning After TEM Observation
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
Metals
Comparison of Fib Tem Specimen Preparation Methods
Microscopy and Microanalysis
Instrumentation
Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries
Microscopy and Microanalysis
Instrumentation
Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;
Materia Japan
Planarization Processes for Pre-Fib Sample Preparation
Microscopy and Microanalysis
Instrumentation
