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Metrology for Emerging Materials, Devices, and Structures: The Example of Graphene
doi 10.1063/1.3251256
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Date
January 1, 2009
Authors
Alain C. Diebold
Erik M. Secula
David G. Seiler
Rajinder P. Khosla
Dan Herr
C. Michael Garner
Robert McDonald
Alain C. Diebold
Publisher
AIP