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TEM Characterization of the Deformed Region Beneath Knoop Indents in Boron Carbide

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927616010242
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Abstract

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Categories
Instrumentation
Date

July 1, 2016

Authors
S. D. WalckJ. C. LaSalviaK. D. Behler
Publisher

Cambridge University Press (CUP)


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