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In situXRD Study of Thickness Dependence of Crystallization of Amorphous Titanium Dioxide Films

Acta Crystallographica Section A Foundations of Crystallography
doi 10.1107/s0108767308082081
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Abstract

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Date

August 23, 2008

Authors
R. KuzelL. NichtovaZ. MatejJ. SichaJ. Musil
Publisher

International Union of Crystallography (IUCr)


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