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In situXRD Study of Thickness Dependence of Crystallization of Amorphous Titanium Dioxide Films
Acta Crystallographica Section A Foundations of Crystallography
doi 10.1107/s0108767308082081
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Date
August 23, 2008
Authors
R. Kuzel
L. Nichtova
Z. Matej
J. Sicha
J. Musil
Publisher
International Union of Crystallography (IUCr)
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