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Refinement of Crystal Structural Parameters and Charge Density Using Convergent-Beam Electron Diffraction
Microscopy and Microanalysis
- United Kingdom
doi 10.1017/s1431927602101954
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Categories
Instrumentation
Date
August 1, 2002
Authors
K. Tsuda
Y. Ogata
M. Tanaka
Publisher
Cambridge University Press (CUP)
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