Electron Density Topological Analysis of Silicon Surfaces. The Case of Si(100)(1x1):H and Si(100)(2x1):H
Acta Crystallographica Section A Foundations of Crystallography
doi 10.1107/s0108767300028348
Full Text
Open PDFAbstract
Available in full text
Date
August 25, 2000
Authors
Publisher
International Union of Crystallography (IUCr)