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Thickness Dependence of the Integrated Bragg Intensity for Statistically Disturbed Silicon Crystals
Applied Physics Letters
- United States
doi 10.1063/1.3531761
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Astronomy
Physics
Date
January 24, 2011
Authors
J. Will
A. Gröschel
M. Weißer
A. Magerl
Publisher
AIP Publishing
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