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Resolution Limit Measured by Fourier Transform: 0.61 Angstrom Information Transfer Through HAADF-STEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927605509322
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Abstract

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Categories
Instrumentation
Date

August 1, 2005

Authors
Y PengA Y BorisevichA R LupiniS J Pennycook
Publisher

Cambridge University Press (CUP)


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