Resolution Limit Measured by Fourier Transform: 0.61 Angstrom Information Transfer Through HAADF-STEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927605509322
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Deconvolution Process of High-Resolution HAADF STEM Images

Microscopy and Microanalysis
Instrumentation
2002English

Improving the STEM Spatial Resolution Limit

Microscopy and Microanalysis
Instrumentation
2018English

High Resolution Spectra of M and C Stars by Fourier Transform Spectroscopy

Highlights of Astronomy
1974English

A Multi-Resolution Texture Image Retrieval Using Fast Fourier Transform

Journal of Engineering Research
Engineering
2010English

Z-Contrast HAADF-STEM Tomography

Microscopy and Microanalysis
Instrumentation
2003English

Ultra High-Mass Resolution Paper Spray by Fourier Transform Ion Cyclotron Resonance Mass Spectrometry

International Journal of Analytical Chemistry
Analytical Chemistry
2012English

Fourier Series and Fourier Transform

IOSR Journal of Mathematics
2013English

Improving Resolution of HAADF STEM Images With Maximum Entropy Method and Deconvolution Processing

Microscopy and Microanalysis
Instrumentation
2005English

Fourier Transform Infrared and Fourier Transform Raman Spectroscopy of Polymers

Structure-Property Relations in Polymers
1993English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy