Generation of Compact Test Sets With High Defect Coverage

doi 10.1109/date.2009.5090833
Full Text
Abstract

Available in full text

Date
Authors
Publisher

IEEE

Related search

Real-Time Java API Specifications for High Coverage Test Generation

2012English

Completeness and Compact Generation in Partially Ordered Sets

Journal of Mathematics and Computer Science
Computational MechanicsComputational MathematicsComputer Science ApplicationsMathematics
2016English

Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill

2013English

Invariance Defect of Sets With Respect to Differential Inclusion

Vestnik Udmurtskogo Universiteta: Matematika, Mekhanika, Komp'yuternye Nauki
Transfer ProcessesMathematicsFluid FlowComputer Science
2011English

Uniform Factorization for Compact Sets of Weakly Compact Operators

Studia Mathematica
Mathematics
2006English

When Compact Sets Are -Closed

Al-Nahrain Journal of Science
2018English

On the Indecomposability of Compact Convex Sets

Proceedings of the American Mathematical Society
MathematicsApplied Mathematics
1992English

Images of Sets by Continuous Multifunction With Compact and Convex Values

International Journal of Mathematical Analysis
2017English

Generic Sets in Definably Compact Groups

Fundamenta Mathematicae
Number TheoryAlgebra
2007English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy