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Substrate Modeling to Improve Reliability of High Voltage Technologies
doi 10.1109/ims3tw.2015.7177884
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Date
June 1, 2015
Authors
Camillo Stefanucci
Pietro Buccella
Yasser Moursy
Hao Zou
Ramy Iskander
Maher Kayal
Jean Michel Sallese
Publisher
IEEE
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