The Impact of Repetitive Unclamped Inductive Switching on the Electrical Parameters of Low-Voltage Trench Power nMOSFETs
IEEE Transactions on Electron Devices - United States
doi 10.1109/ted.2010.2049062
Full Text
Open PDFAbstract
Available in full text
Date
July 1, 2010
Authors
Publisher
Institute of Electrical and Electronics Engineers (IEEE)