Amanote Research
Register
Sign In
Real-Time Optical Control of Ga(1-X)In(x)P Film Growth
doi 10.21236/ada445705
Full Text
Open PDF
Abstract
Available in
full text
Date
August 1, 1999
Authors
N. Dietz
V. Woods
K. Ito
I. Lauko
Publisher
Defense Technical Information Center
Related search
Optical Microscanning X-Ray Real-Time Imaging System
Real-Time X-Ray Diffraction Measurements of Structural Dynamics and Polymorphism in Diindenoperylene Growth
Applied Physics A: Materials Science and Processing
Materials Science
Chemistry
Effect of Composition on Electrical and Optical Properties of Thin Films of Amorphous Ga X Se100−x Nanorods
Nanoscale Research Letters
Materials Science
Nanotechnology
Condensed Matter Physics
Nanoscience
Compositional Studies of Optical Parameters in (Ag3AsS3)x(As2S3)1–x (X = 0.3; 0.6; 0.9) Thin Films
Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.
Hyomen Kagaku
The Canonical Subgroup of {$E$} Is {${\Rm Spec}\,{\bf R}[x]/(X\sp P+\frac{p}{E\sb {P-1}(E,\omega)}x)$}
Asian Journal of Mathematics
Mathematics
Applied Mathematics
The Stability of Evolutionary P ( X ) $P(x)$ -Laplacian Equation
Boundary Value Problems
Number Theory
Analysis
Algebra
Relaxation Rate and Polarization Charge Density Model for AlN/Al$_{x}$Ga$_{1 - X}$N/AlN Heterostructures
Turkish Journal of Electrical Engineering and Computer Sciences
Electronic Engineering
Electrical
Computer Science
(3) Quality Control of a Rapid X-Ray Film Processer
Nippon Hoshasen Gijutsu Gakkai zasshi
Medicine
