Terahertz Analysis Reveals Nanostructural Dependence of Carbon Thin-Film Properties

SPIE Newsroom
doi 10.1117/2.1201202.004113
Full Text
Abstract

Available in full text

Date
Authors
Publisher

SPIE-Intl Soc Optical Eng

Related search

Polarization-Dependent Thin-Film Wire-Grid Reflectarray for Terahertz Waves

Applied Physics Letters
AstronomyPhysics
2015English

Role of Resonance Modes on Terahertz Metamaterials Based Thin Film Sensors

Scientific Reports
Multidisciplinary
2017English

Graphene Oxide/Carbon Nanoparticle Thin Film Based IR Detector: Surface Properties and Device Characterization

AIP Advances
NanotechnologyAstronomyPhysicsNanoscience
2015English

Characterization of Ultra-Thin Carbon Film Prepared From Polyimide Langmuir-Blodgett Film

TANSO
1999English

Analysis of Thin Film Fire Sensors

Microelectronics Journal
1985English

Electrical Properties of Nanoscale ZnS Thin Film Transistor

Journal of Nanomaterials
Materials ScienceNanotechnologyNanoscience
2015English

Photoelectronic Properties of MoS2/CdS Thin Film Heterojunction

2015English

Magnetic Properties of Thin Film With S = 1

Acta Physica Polonica A
AstronomyPhysics
1997English

Thin Film Composites of Nanocrystalline Diamond Particles and Diamond-Like Carbon: Structural, Electrochemical and Biological Properties

Journal of Aerospace Engineering, Sciences and Applications
2012English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy