Simple Filters Enable X-Ray Polarization Measurements
SPIE Newsroom
doi 10.1117/2.1200904.1585
Full Text
Open PDFAbstract
Available in full text
Date
January 1, 2009
Authors
Publisher
SPIE-Intl Soc Optical Eng
Available in full text
January 1, 2009
SPIE-Intl Soc Optical Eng