Vision Based, Statistical Learning System for Fault Recognition in Industrial Assembly Environment

doi 10.1109/etfa.2016.7733730

Full Text

Abstract

Available in

Date

September 1, 2016

Authors

First Zs. J. Viharos

Second D. Chetverikov

Fourth R. Saghegyi

Sixth L. Zalanyi

Seventh I. Pomozi

Eighth Sz. Soos

Ninth Zs. Kover

Publisher

IEEE

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