Reflection and Transmission Ellipsometry of a Uniform Layer

Journal of the Optical Society of America A: Optics and Image Science, and Vision - United States
doi 10.1364/josaa.4.002096
Full Text
Abstract

Available in full text

Date
Authors
Publisher

The Optical Society

Related search

New Features of the Layer‐by‐layer Deposition of Microcrystalline Silicon Films Revealed by Spectroscopic Ellipsometry and High Resolution Transmission Electron Microscopy

Applied Physics Letters
AstronomyPhysics
1996English

Ultrafast Terahertz Transmission Ellipsometry of YMn2O5 Electromagnons

Applied Physics Letters
AstronomyPhysics
2012English

Real-Time Ellipsometry-Based Transmission Ultrasound Imaging

2007English

Reflection and Transmission of Beams at a Dielectric Interface

SIAM Journal on Applied Mathematics
Applied Mathematics
1973English

Transmission and Reflection of Internal Wave Beams

Physics of Fluids
Mechanics of MaterialsCondensed Matter PhysicsMechanical EngineeringFluid FlowTransfer ProcessesComputational Mechanics
2010English

Reflection Coefficient of a Fluid-Coupled Elastic Layer

1990English

Transmission and Reflection of Electrons by Aluminum Foils.

1963English

Transmission and Reflection at the Boundary of a Random Two-Component Composite

Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences
MathematicsEngineeringAstronomyPhysics
2020English

Recovery of a Potential From the Ratio of Reflection and Transmission Coefficients

Journal of Mathematical Physics
Nonlinear PhysicsMathematical PhysicsStatistical
2003English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy