Structural Properties of A-Si Films and Their Effect on Aluminum Induced Crystallization

AIP Advances - United States
doi 10.1063/1.4933193
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Effect of Annealing Time on Aluminum-Induced Crystallization of Silicon Suboxide Thin Films

EPJ Web of Conferences
AstronomyPhysics
2019English

Laser Induced Crystallization of A-Si : H Thin Films

Journal de Physique Lettres
1982English

Structural Characterization of Poly-Si Films Crystallized by Ni Metal Induced Lateral Crystallization

Scientific Reports
Multidisciplinary
2019English

Electron Microscopy Study of Ni Induced Crystallization in Amorphous Si Thin Films

2015English

Annealing Effect on Electric Properties of Aluminum Oxide Films on Metal Substrates.

SHINKU
1988English

Structural and Electronic Properties of CVD Silicon Films Near the Crystallization Temperature

Le Journal de Physique Colloques
1982English

Study of SiOx Thickness Effects on Aluminum-Induced Crystallization

AIP Advances
NanotechnologyAstronomyPhysicsNanoscience
2017English

Effect of Trimethyl-Aluminum Preflow on the Structure and Strain Properties of AlN Films

Chinese Journal of Luminescence
RadiationOpticalElectronicCondensed Matter PhysicsMagnetic Materials
2012English

Morphological, Compositional, Structural, and Optical Properties of Si-Nc Embedded in SiOx Films

Nanoscale Research Letters
Materials ScienceNanotechnologyCondensed Matter PhysicsNanoscience
2012English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy