Frequency Metrology on theMg3s2S1→3s4pP1line for Comparison With Quasar Data

Physical Review A
doi 10.1103/physreva.74.012505
Full Text
Abstract

Available in full text

Date
Authors
Publisher

American Physical Society (APS)

Related search

Metrology for High-Frequency Nanoelectronics

AIP Conference Proceedings
AstronomyPhysics
2007English

All-Normal-Dispersion Fiber Lasers for Frequency Metrology

2011English

Frequency Metrology in Quantum Degenerate Helium

EPJ Web of Conferences
AstronomyPhysics
2013English

Introduction to Time and Frequency Metrology

Review of Scientific Instruments
MedicineInstrumentation
1999English

Laser Generated Ultrasound Sources Using Polymer Nanocomposites for High Frequency Metrology

2017English

Morphological Method for Surface Metrology and Dimensional Metrology Based on the Alpha Shape

Measurement Science and Technology
InstrumentationEngineeringApplied Mathematics
2011English

Comparison of Low‐frequency Data From Co‐located Receivers

2010English

Multi-Frequency VLBI Studies of the Optically Violent Variable Quasar NRAO530

2011English

Comparison of Low‐frequency Acoustic Backscatter Data With Model Predictions Using Fine‐scale Geomorphology

Journal of the Acoustical Society of America
AcousticsUltrasonicsArtsHumanities
1994English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy