Observation of Sn Thin Film Growth on Si(111) Surface Using Time of Flight Impact Collision Ion Scattering Spectroscopy.

SHINKU
doi 10.3131/jvsj.42.208
Full Text
Abstract

Available in full text

Date
Authors
Publisher

The Vacuum Society of Japan

Related search

Determination of Surface Polarity of C-Axis Oriented ZnO Films by Coaxial Impact-Collision Ion Scattering Spectroscopy

Applied Physics Letters
AstronomyPhysics
1998English

Analysis of Pb(II) Ion Sensing by Crosslinked Chitosan Thin Film Using Surface Plasmon Resonance Spectroscopy

Optik
Electronic EngineeringOpticsMolecular Physics,OpticalElectricalAtomicMagnetic MaterialsElectronic
2013English

Progress on Sn-Based Thin-Film Anode Materials for Lithium-Ion Batteries

Chinese Science Bulletin
2012English

Immobilization of Tetrabutyl Thiuram Disulfide in Chitosan Thin Film for Sensing Zinc Ion Using Surface Plasmon Resonance Spectroscopy

Sensors and Materials
Materials ScienceInstrumentation
2013English

Effect of Surface Energy on Pentacene Thin-Film Growth and Organic Thin Film Transistor Characteristics

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
EngineeringAstronomyPhysics
2009English

Real Time Uhv-Hrtem Observation of Si(111)√3x√3-Pd Surface and Dynamic Motion of Pd Clusters

Microscopy and Microanalysis
Instrumentation
2002English

Electronic Structure, Surface Morphology, and Topologically Protected Surface States of Sb2Te3 Thin Films Grown on Si(111)

Journal of Applied Physics
AstronomyPhysics
2013English

Surface Structures of Binary Mixtures of Imidazolium-Based Ionic Liquids Using High-Resolution Rutherford Backscattering Spectroscopy and Time of Flight Secondary Ion Mass Spectroscopy

Journal of Chemical Physics
MedicineTheoretical ChemistryAstronomyPhysicsPhysical
2013English

Agglomeration and Dendritic Growth of Cu/Ti/Si Thin Film

Journal of Nanomaterials
Materials ScienceNanotechnologyNanoscience
2014English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy