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SEFI Modeling in Readout Integrated Circuit Induced by Heavy Ions at Cryogenic Temperatures
IEEE Transactions on Nuclear Science
- United States
doi 10.1109/tns.2018.2880791
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Abstract
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Categories
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Date
January 1, 2019
Authors
L. Artola
S. Ducret
F. Advent
G. Hubert
J. Mekki
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
