Direct Observations of Site Hopping of Individual Antimony Atoms in Silicon Crystals by Cs-Corrected STEM

Materia Japan
doi 10.2320/materia.45.855
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Japan Institute of Metals

Related search

New Possibility of Direct Observations of Quantum Dots, Nanotubes and Interfaces by Cs-Corrected HRTEM

Microscopy and Microanalysis
Instrumentation
2003English

Structural Characterization of Pt–Pd Core–shell Nanoparticles by Cs-Corrected STEM

Journal of Nanoparticle Research
Materials ScienceNanoscienceCondensed Matter PhysicsMolecular Physics,SimulationAtomicBioengineeringModelingNanotechnologyChemistryOptics
2012English

Cs-Corrected HAADF-STEM Observations on the Structural Modulations Caused by Charge Density Wave and Te-Vacancy Ordering in LaTe2−δ

Chinese Science Bulletin
2017English

Structure of an Al–Cu–Co Decagonal Quasicrystal Studied by Cs-Corrected STEM

Materials Transactions
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2014English

Depth Sectioning of Individual Dopant Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy

Applied Physics Letters
AstronomyPhysics
2008English

Investigation of 6T@SWCNT by Cs-Corrected Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2009English

Hopping Conductivity in One-dimensionalCa3Co2O6single Crystals

Physical Review B
2002English

Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

Microscopy and Microanalysis
Instrumentation
2010English

Electrical Current Through Individual Pairs of Phosphorus Donor Atoms and Silicon Dangling Bonds

Scientific Reports
Multidisciplinary
2016English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy