Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode Using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM
Microscopy and Microanalysis - United Kingdom
doi 10.1017/s143192761501065x
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August 1, 2015
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Cambridge University Press (CUP)