Amanote Research
Register
Sign In
Probing Molecular Orientations in Thin Films by X-Ray Photoelectron Spectroscopy
AIP Advances
- United States
doi 10.1063/1.5025175
Full Text
Open PDF
Abstract
Available in
full text
Categories
Nanotechnology
Astronomy
Physics
Nanoscience
Date
March 1, 2018
Authors
Y. Li
P. Li
Z.-H. Lu
Publisher
AIP Publishing
Related search
X-Ray Photoelectron Spectroscopy Study of MgH2 Thin Films Grown by Reactive Sputtering
Surface and Interface Analysis
Surfaces
Condensed Matter Physics
Interfaces
Materials Chemistry
Films
Coatings
Chemistry
Deposition and X-Ray Photoelectron Spectroscopy Studies on Sputtered Cerium Dioxide Thin Films
X-Ray Photoelectron Spectroscopy and Raman Spectroscopy Studies on Thin Carbon Nitride Films Deposited by Reactive RF Magnetron Sputtering
World Journal of Nano Science and Engineering
X-Ray Photoelectron Spectroscopy
Analysis of Sawdust by X-Ray Photoelectron Spectroscopy
Surface Science Spectra
Surfaces
Films
Coatings
Interfaces
Condensed Matter Physics
Probing Slow Dynamics on Glass Transition in Thin Polystyrene Films by X-Ray Reflectivity
Acta Crystallographica Section A Foundations of Crystallography
Surface Termination Conversion During SrTiO3 Thin Film Growth Revealed by X-Ray Photoelectron Spectroscopy
Scientific Reports
Multidisciplinary
Grazing Incidence X-Ray Photoelectron Spectroscopy:
Journal of Surface Analysis
Ni-(In,Ga)As Alloy Formation Investigated by Hard-X-Ray Photoelectron Spectroscopy and X-Ray Absorption Spectroscopy
Physical Review Applied
Astronomy
Physics
