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Nonlinear Behavior of Microwave Semiconductor Materials Measured Under a Strong Electromagnetic Environment Using a Compressed Rectangular Resonant Cavity
Applied Physics A: Materials Science and Processing
- Germany
doi 10.1007/s00339-017-1025-z
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Categories
Materials Science
Chemistry
Date
May 16, 2017
Authors
E. Li
Y. Gao
Y. Zhang
C. Gao
H. Zheng
Z. Zeng
Publisher
Springer Science and Business Media LLC
