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LRM Probe-Tip Calibrations Using Nonideal Standards

IEEE Transactions on Microwave Theory and Techniques - United States
doi 10.1109/22.348112
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Abstract

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Categories
Electronic EngineeringRadiationElectricalCondensed Matter Physics
Date

January 1, 1995

Authors
D.F. WilliamsR.B. Marks
Publisher

Institute of Electrical and Electronics Engineers (IEEE)


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