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Rayleigh-Scattering Microscopy for Tracking and Sizing Nanoparticles in Focused Aerosol Beams

doi 10.1107/s2052252518010837/ec5009sup1.pdf
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Abstract

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Date

September 11, 2018

Authors
Max F. HantkeJohan BieleckiOlena KulykDaniel WestphalDaniel S. D. LarssonMartin SvendaHemanth K. N. ReddyRichard A. KirianJakob AndreassonJanos HajduFilipe R. N. C. Maia
Publisher

International Union of Crystallography (IUCr)


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