Mechanical and Electrical Properties of ZnO-Nanowire/Si-Substrate Junctions Studied by Scanning Probe Microscopy

Acta Physica Polonica A - Poland
doi 10.12693/aphyspola.112.255
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Institute of Physics, Polish Academy of Sciences

Related search

Layer-Dependent Nanoscale Electrical Properties of Graphene Studied by Conductive Scanning Probe Microscopy

Nanoscale Research Letters
Materials ScienceNanotechnologyCondensed Matter PhysicsNanoscience
2011English

Local Mechanical and Electrical Behavior in CdTe Thin Film Solar Cells Revealed by Scanning Probe Microscopy

AIP Advances
NanotechnologyAstronomyPhysicsNanoscience
2019English

Electrical and Structural Characterization of GaN P-N Heterostuctures by Scanning Probe Microscopy

Microscopy and Microanalysis
Instrumentation
2002English

Aromatic Azide Transformation on the Ag(111) Surface Studied by Scanning Probe Microscopy

Angewandte Chemie - International Edition
CatalysisChemistry
2019English

Aromatic Azide Transformation on the Ag(111) Surface Studied by Scanning Probe Microscopy

Angewandte Chemie
2019English

Step-Step Interaction on Vicinal Si(001) Surfaces Studied by Scanning Tunneling Microscopy

Physical Review B
2009English

Scanning Probe Microscopy

2020English

Scanning Probe Microscopy

2010English

Scanning Probe Microscopy

Journal of Adhesion
SurfacesMechanics of MaterialsInterfacesMaterials ChemistryFilmsCoatingsChemistry
2000English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy