Characterization of a Thick Layer A-Si:H Pixel Detector With TFA Technology Using a Scanning Electron Microscope
Journal of Non-Crystalline Solids - Netherlands
doi 10.1016/j.jnoncrysol.2005.12.054
Full Text
Open PDFAbstract
Available in full text
Categories
Date
June 1, 2006
Authors
Publisher
Elsevier BV