Characterization of a Thick Layer A-Si:H Pixel Detector With TFA Technology Using a Scanning Electron Microscope

Journal of Non-Crystalline Solids- Netherlands

doi 10.1016/j.jnoncrysol.2005.12.054

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Condensed Matter Physics

Materials Chemistry

Magnetic Materials

Date

June 1, 2006

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Publisher

Elsevier BV

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