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H2S Dosimeter With Controllable Percolation Threshold Based on Semi-Conducting Copper Oxide Thin Films

Journal of Sensors and Sensor Systems - Germany

doi 10.5194/jsss-6-163-2017

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May 2, 2017

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Copernicus GmbH

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H<sub>2</Sub>S Dosimeter With Controllable Percolation Threshold Based on Semi-Conducting Copper Oxide Thin Films

Journal of Sensors and Sensor Systems - Germany

doi 10.5194/jsss-6-163-2017

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Electrical Properties and Phase Behavior of Proton Conducting Nanocomposites Based on the Polymer System (1 － X)[PVOH + H<sub>3</Sub>PO<sub>2</Sub> + H<sub>2</Sub>O]·x(Nb<sub>2</Sub>O<sub>5</Sub>)

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H&lt;sub&gt;2&lt;/Sub&gt;S Dosimeter With Controllable Percolation Threshold Based on Semi-Conducting Copper Oxide Thin Films

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doi 10.5194/jsss-6-163-2017

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