Electronic Behaviors of Individual Defects and Boundaries in 2D Materials: A Spatially Resolved Study With Multi-Probe Scanning Tunneling Microscopy

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927616002671
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Bulk Electronic Structure of Metals Resolved With Scanning Tunneling Microscopy

Physical Review Letters
AstronomyPhysics
2006English

Bases for Time-Resolved Probing of Transient Carrier Dynamics by Optical Pump–probe Scanning Tunneling Microscopy

Nanoscale
Materials ScienceNanotechnologyNanoscience
2013English

Proximity Effect Between Two Superconductors Spatially Resolved by Scanning Tunneling Spectroscopy

Physical Review X
AstronomyPhysics
2014English

Fabrication of a Nanometer Scaled Device With Multi Scanning Probe Microscopy.

Hyomen Kagaku
2002English

Scanning Tunneling Microscopy

1993English

Enhanced 2D Plotting Method for Scanning Probe Microscopy Imaging

Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic EngineeringOpticsMolecular Physics,OpticalElectricalAtomicMagnetic MaterialsElectronic
2011English

A Perspective on the Application of Spatially Resolved ARPES for 2D Materials

2018English

Surface Structure and Analysis With Scanning Probe Microscopy and Electron Tunneling Spectroscopy. Final Report

1998English

Electronic Properties of Individual Diarylethene Molecules Studied Using Scanning Tunneling Spectroscopy

Journal of Applied Physics
AstronomyPhysics
2012English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy