Measurement of the Emission Lifetime of a GaN Interface Fluctuation Quantum Dot by Power Dependent Single Photon Dynamics (Phys. Status Solidi a 9∕2018)
Physica Status Solidi (A) Applications and Materials Science - Germany
doi 10.1002/pssa.201870017
Full Text
Open PDFAbstract
Available in full text
Categories
Date
May 1, 2018
Authors
Publisher
Wiley