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Structural Characterization of Polycrystalline Ge Thin Films on Insulators Formed by Diffusion-Enhanced Al-Induced Layer Exchange
doi 10.7567/ssdm.2013.p-2-5
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Date
September 25, 2013
Authors
R. Numata
K. Toko
N. Oya
N. Usami
T. Suemasu
Publisher
The Japan Society of Applied Physics
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